Abstract: One of the main reasons of metal film capacitors failure in pulse modes is a degradation of contacts between film metallization and solid electrodes-contact edges. This paper presents the ...

Abstract: The lifetimes of metal-insulator-metal (MIM) capacitors are predicted from voltage step stress data. Capacitor areas of 400, 5625 and 11250 /spl mu/m/sup 2/ are investigated. The reliability ...