Abstract: One of the main reasons of metal film capacitors failure in pulse modes is a degradation of contacts between film metallization and solid electrodes-contact edges. This paper presents the ...

Abstract: The lifetimes of metal-insulator-metal (MIM) capacitors are predicted from voltage step stress data. Capacitor areas of 400, 5625 and 11250 /spl mu/m/sup 2/ are investigated. The reliability ...

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Okay, we’ve just left May and stepped into June, why are we talking about Arduino Day — traditionally a March 16 th event where makers congregate and share projects? I live in Ho Chi Minh City, and ...