Abstract: This work presents silicon data from 28 nm test chips specifically designed to study electromigration (EM) induced lifetime effects. The power grids were generated by an automatic ...

The A15+ ticks both boxes. Our ideal starting point would include sources such as the Rega Planar 3/Nd3 record player, the ...

Abstract: Cryogenic electronics remains a promising direction for increasing the power density of power converters. However, the reliability characteristics of power semiconductor components cooled by ...