Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

Scanning electron microscopy (SEM) images are already a common staple of battery research. Now, they can be paired with a simple algorithm to enable better prediction of lithium metal battery ...

This study presents a comprehensive investigation into the intricate microstructural characteristics of tight reservoir rocks, utilizing advanced micro-CT scanning and FIB-SEM technologies. Micro-CT ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

You can create a release to package software, along with release notes and links to binary files, for other people to use. Learn more about releases in our docs.

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Abstract: Scanning electron microscopy (SEM) plays an important role in providing high-resolution imaging in various fields, including industrial chip manufacturing, materials science, and nanoscale ...

Visual Studio Code (VSCode): https://code.visualstudio.com/download The Conda package manager Miniforge: https://conda-forge.org/download/ Git: https://git-scm.com ...

Creative Commons (CC): This is a Creative Commons license. Attribution (BY): Credit must be given to the creator. Scanning electrochemical cell microscopy (SECCM) produces nanoscale-resolution ...